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Metrological Control : Industrial Measurement Management

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Title: Metrological Control : Industrial Measurement Management
Author: Hiroshi Yano
ISBN: 9283311078 / 9789283311072
Format: Hard Cover
Pages: 521
Publisher: APO
Year: 1991
Availability: In Stock
     
 
  • Description
  • Contents

Metrological control encompasses more than control of measurement techniques. The measurement management process involves determining what measurements to make and how to use measurement data to improve the quality of your products and processes.
Metrological Control-Industrial Measurement Management presents the general tools and methods of metrological control and shows you how to design a metrological control system that can support your entire production system.

Foreword
Preface
Tables
Figures
Notation

Part 1 : Introduction
Chapter 1 : Overview of Metrology
Chapter 2 : Product Tolerances and Metrological Control
Chapter 3 : Experimental Design
Chapter 4 : Treatment of Experimental Data
Chapter 5 : Comparing Measurement Methods : Finding the S/N Ratio
Chapter 6 : Comparing the Merits of Different Processes : S/N Ratio with Two Controllable Factors

Part 2 : Off-Line Metrological Control
Chapter 7 : Selection of Measurement Items and Optimum Production Conditions : Analysis of Variance of Multidimensional Arrays
Chapter 8 : Selection of Characteristics Values : Using the L18 Orthogonal Array
Chapter 9 : Parameter Design of a Measuring Instrument by Experiment : Effective Use of Orthogonal Arrays and the S/N Ratio
Chapter 10 : Parameter Design of Measuring Instrument from Theory : Direct Products of L18 X L18 Orthogonal Arrays
Chapter 11 : Measurement Standards and How They Are Set : Using the Sequential Categorization Method
Chapter 12 : Making Stable Standard Specimens : Using Parameter Design to Combat Aging
Chapter 13 : Determining Measurement Error : Specimen Error and Instrument Error
Chapter 14 : Data Analysis by Orthogonal Polynomials : Missing Values and Unequal Repetitions
Chapter 15 : Analysis of Discrete Data : Precise Accumulation Method
Chapter 16 : Education and Training of Measurement Personnel : Application of Data Analysis
Chapter 17 : Education and Training of Measurement Managers : Data Analysis for Education and Training

Part 3 : Off-Line Measurement and Process Engineering
Chapter 18 : Setting Process Parameters : Combining L8 with a One-Way Layout
Chapter 19 : S/N Ratio of Dynamic Characteristics : L18 X L18 Parameter Design
Chapter 20 : Measurement Error and Process Error : Analysis of Variance by Split-Plot Design
Chapter 21 : Effective Use of Measurement Data in Process Engineering

Part 4 : On-Line Metrological Control
Chapter 22 : Inspection and Fraction Defective of Break-Even Point
Chapter 23 : Loss Functions for Inspection and Control : A Simple Method of Determining Calibration Intervals
Chapter 24 : Instrument Calibration in the Production Process
Chapter 25 : Process Calibration Interval and Prediction Error

Part 5 : Overview
Chapter 26 : Designing a Metrological Control System

Appendixes
1 : F Distribution
2 : Basic Formulas Related to the S/N Ratio
3 : Omega Conversion Table
4 : Orthogonal Arrays
5 : Normal Distribution
6 : Coefficients of Orthogonal Polynomials
Bibliography
Index
About the Author

 
 
 
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