The importance of testing integrated circuits (ICs) has escalated with the increasing complexity of circuits fabricated on a single IC chip. No longer is it possible to design a new IC and then think about testing: such considerations must be part of the initial design activity, and testing strategies must be part of every circuit and system designer's education. This book is a comprehensive introduction and reference for all aspects of IC testing. It includes all of the basic concepts and theories necessary for advanced students, through practical test strategies and industrial practice, to the economic and managerial aspects of testing. In addition to comprehensive and detailed coverage of digital network testing, VLSI testing also considers in depth the growing area of testing analogue and mixed analogue/digital ICs, used particularly in signal processing.
Preface
Acknowledgements
List of Symbols and Abbreviations
Chapter 1: Introduction
Chapter 2: Faults in Digital Circuits
Chapter 3: Digital Test Pattern Generation
Chapter 4: Signature and Self Test
Chapter 5: Structured Design for Testability (DFT) Techniques
Chapter 6: Testing of Structured Digital Circuits and Microprocessors
Chapter 7: Analogue Testing
Chapter 8: Mixed Analogue/Digital System Test
Chapter 9: The Economics of Test and Final overall Summary
Appendix
Index
