Not Registered Yet? REGISTER NOW

Forgot Password

Welcome Guest

0 items in your shopping cart

Currency: Listed Currency

Choose Currency

Listed Currency

` Rupees

$ US DOLLAR

� British Pound

€ EURO

� JAPANESE YEN

Sfr SWISS FRANC

CDN$ CANADIAN DOLLAR

A$ Australian Dollar

S$ Singapore Dollar

SEK Swedish Kroner

BDT Bangladeshi Taka

BROWSE BY SUBJECTS

BROWSE BY PUBLISHERS




	A Numerical Primer for the Chemical Engineer, 2nd Edition

	Electrical Power Transmission System Engineering : Analysis and Design, 3rd Edition

	Modern Power Systems Analysis

	Patent Fundamentals for Scientists and Engineers, 3rd Edition

	Hazardous Chemicals Safety & Compliance Handbook for the Metalworking Industries






Join our mailing list to recieve newsletters

	SAE J2052 : 2016 Title: Test Device Head Contact Duration Analysis Pages: 7 Year: 2016 Publisher: SAE Availability: Within 1-2 working days


Description This methodology can be used for all calculations of HIC, with all test devices having an upper neck triaxial load cell mounted rigidly to the head, and head triaxial accelerometers

Tel. 43586946, 43586947
Email : info@standardsmedia.com

Site designed & developed by Infomedia Web Solutions