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This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand and eliminate electronic device and system failures. Case histories and review papers are included, as well as guides to new and unique tools and methodologies, applications and results.
Topics include: Advanced Techniques • Failure Analysis Process • MEMS • System Level Analysis • Circuit Editing • Die Level Fault Isolation • Optical Techniques • Package-Level Analysis • Sample Preparation • Optical Techniques • Yield Enhancement • Metrology & Materials Analysis • Optoelectronic Devices • Circuit Edit Techniques • SPM Techniques • Nanotechnology Analysis
