Microstructural Characterization of Materials, 2nd Edition

Title: Microstructural Characterization of Materials, 2nd Edition
Author: David Brandon, Wayne D. Kaplan
ISBN: 0470027851 / 9780470027851
Format: Hard Cover
Pages: 550
Publisher: Wiley
Year: 2008
Availability: 45-60 days

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Microstructural Characterization of Materials, 2nd Edition is an introduction to the expertise involved in assessing the microstructure of engineering materials and to the experimental methods used for this purpose. Similar to the first edition, this 2nd edition explores the methodology of materials characterization under the three headings of crystal structure, microstructural morphology, and microanalysis. The principal methods of characterization, including diffraction analysis, optical microscopy, electron microscopy, and chemical microanalytical techniques are treated both qualitatively and quantitatively. An additional chapter has been added to the new edition to cover surface probe microscopy, and there are new sections on digital image recording and analysis, orientation imaging microscopy, focused ion-beam instruments, atom-probe microscopy, and 3-D image reconstruction.

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Preface to the Second Edition
Preface to the First Edition

Chapter 1 : The Concept of Microstructure
Chapter 2 : Diffraction Analysis of Crystal Structure
Chapter 3 : Optical Microscopy
Chapter 4 : Transmission Electron Microscopy
Chapter 5 : Scanning Electron Microscopy
Chapter 6 : Microanalysis in Electron Microscopy
Chapter 7 : Scanning Probe Microscopy and Related Techniques
Chapter 8 : Chemical Analysis of Surface Composition
Chapter 9 : Quantitative and Tomographic Analysis of Microstructure

Appendices
Index