The 2019 edition of ASM Handbook, Volume 10: Materials Characterization provides detailed technical information that will enable readers to select and use analytical techniques that are appropriate for their problem. Each article describing a characterization technique begins with an overview of the method in simplified terms and lists common applications as well as limitations. Sample size, form, and special preparation requirements are listed upfront to help readers quickly decide if the techniques are appropriate to solve their problem. Tables and charts listing the most common characterization methods for different classes of materials are included in the beginning of the handbook. The tables give information on whether the technique is suitable for elemental analysis, qualitative analysis, surface analysis, or alloy verification. The articles also describe material characterization in general terms according to material type and serve as a jumping off point to the more specific technique articles.
Foreword
Preface
List of Contributors
Policy on Units of Measure
Part I : Introduction to Materials Analysis Methods
Chapter 1 : Introduction to Material Analysis and Characterization Chapter 2 : Characterization of Metals and Alloys Chapter 3 : Semiconductor Characterization Chapter 4 : Characterization of Glasses and Ceramics Chapter 5 : Introduction to Characterization of Organic Solids and Organic Liquids Chapter 6 : Introduction to Characterization of Powders
Part II : Spectroscopy
Chapter 7 : Optical Emission Spectroscopy Chapter 8 : Atomic Absorption Spectroscopy Chapter 9 : Inductively Coupled Plasma Optical Emission Spectroscopy Chapter 10 : Infrared Spectroscopy Chapter 11 : Raman Spectroscopy Chapter 12 : Magnetic Resonance Spectroscopy
Part III : Mass and Ion Spectrometry
Chapter 13 : Solid Analysis by Mass Spectrometry Chapter 14 : Gas Analysis by Mass Spectrometry Chapter 15 : Glow Discharge Mass Spectrometry Chapter 16 : Inductively Coupled Plasma Mass Spectrometry Chapter 17 : Rutherford Backscattering Spectrometry Chapter 18 : Low-Energy Ion-Scattering Spectroscopy
Part IV : Chemical Analysis and Separation Techniques
Chapter 19 : Calibration and Experimental Uncertainty Chapter 20 : Chemical Spot Tests; Presumptive Tests Chapter 21 : Classical Wet Analytical Chemistry Chapter 22 : Gas Chromatography Chapter 23 : Gas Chromatography Mass Spectrometry (GC-MS) Chapter 24 : Liquid Chromatography Chapter 25 : Ion Chromatography Chapter 26 : Electrochemical Methods Chapter 27 : Neutron Activation Analysis
Part V : Thermal Analysis
Chapter 28 : Differential Scanning Calorimetry Chapter 29 : Thermogravimetric Analysis Chapter 30 : Dynamic Mechanical Analysis Chapter 31 : Thermomechanical Analysis
Part VI : X-Ray Analysis
Chapter 32 : X-Ray Spectroscopy Chapter 33 : Extended X-Ray Absorption Fine Structure Chapter 34 : Particle Induced X-Ray Emission Chapter 35 : Mossbauer Spectroscopy
Part VIII : Light Optical Metallography
Chapter 44 : Light Optical Metallography Chapter 45 : Quantitative Metallography
Part IX : Microscopy and Microanalysis
Chapter 46 : Scanning Electron Microscopy Chapter 47 : Crystallographic Analysis by Electron Backscatter Diffraction in the Scanning Electron Microscope Chapter 48 : Transmission Electron Microscopy Chapter 49 : Electron Probe X-ray Microanalysis Chapter 50 : Focused Ion Beam Instruments
Part X : Surface Analysis
Chapter 51 : Introduction to Surface Analysis Chapter 52 : Auger Electron Spectroscopy Chapter 53 : Low Energy Electron Diffraction Chapter 54 : Introduction to Scanning Probe Microscopy Chapter 55 : Atomic Force Microscopy Chapter 56 : Secondary Ion Mass Spectroscopy Chapter 57 : X-Ray Photoelectron Spectroscopy Chapter 58 : Thermal Desorption Spectroscopy
Part XI : Reference Information
Glossary of Terms
Index