BSI Standards
Total Record : 40617
BS EN 60747-16-10:2004 :
Semiconductor devices Technology Approval Schedule (TAS) for monolithic microwave integrated circuitsAvailability: Within 1-2 working days
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| List Price: £ 268 |
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BS EN 60747-16-1:2002+A2:2017 :
Semiconductor devices Microwave integrated circuits. AmplifiersAvailability: Within 1-2 working days
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| List Price: £ 289 |
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BS EN 60747-16-3:2002+A2:2017 :
Semiconductor devices Microwave integrated circuits. Frequency convertersAvailability: Within 1-2 working days
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| List Price: £ 268 |
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BS EN 60747-16-4:2004+A2:2017 :
Semiconductor devices Microwave integrated circuits. SwitchesAvailability: Within 1-2 working days
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| List Price: £ 254 |
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BS EN 60747-16-5:2013+A1:2020 :
Semiconductor devices Microwave integrated circuits. OscillatorsAvailability: Within 1-2 working days
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| List Price: £ 254 |
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BS EN 60747-2:2016 :
Semiconductor devices Discrete devices. Rectifier diodesAvailability: Within 1-2 working days
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| List Price: £ 254 |
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BS EN 60747-5-1:2001 :
Discrete semiconductor devices and integrated circuits. Optoelectronic devices GeneralAvailability: Within 1-2 working days
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| List Price: £ 192 |
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BS EN 60747-5-2:2001 :
Discrete semiconductor devices and integrated circuits. Optoelectronic devices Essential ratings and characteristicsAvailability: Within 1-2 working days
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| List Price: £ 225 |
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BS EN 60747-5-3:2001 :
Discrete semiconductor devices and integrated circuits. Optoelectronic devices Measuring methodsAvailability: Within 1-2 working days
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| List Price: £ 254 |
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BS EN 60749-10:2002 :
Semiconductor devices. Mechanical and climatic test methods Mechanical shockAvailability: Within 1-2 working days
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| List Price: £ 116 |
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BS EN 60749-11:2002 :
Semiconductor devices. Mechanical and climatic test methods Rapid change of temperature. Two-fluid-bath methodAvailability: Within 1-2 working days
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| List Price: £ 116 |
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BS EN 60749-14:2003 :
Semiconductor devices. Mechanical and climatic test methods Robustness of terminations (lead integrity)Availability: Within 1-2 working days
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| List Price: £ 138 |
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BS EN 60749-16:2003 :
Semiconductor devices. Mechanical and climatic test methods Particle impact noise detection (PIND)Availability: Within 1-2 working days
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| List Price: £ 116 |
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BS EN 60749-19:2003+A1:2010 :
Semiconductor devices. Mechanical and climatic test methods Die shear strengthAvailability: Within 1-2 working days
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| List Price: £ 116 |
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BS EN 60749-1:2003 :
Semiconductor devices. Mechanical and climatic test methods GeneralAvailability: Within 1-2 working days
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| List Price: £ 116 |
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BS EN 60749-20-1:2009 :
Semiconductor devices. Mechanical and climatic test methods Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heatAvailability: Within 1-2 working days
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| List Price: £ 225 |
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BS EN 60749-21:2011 :
Semiconductor devices. Mechanical and climatic test methods SolderabilityAvailability: Within 1-2 working days
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| List Price: £ 192 |
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BS EN 60749-22:2003 :
Semiconductor devices. Mechanical and climatic test methods Bond strengthAvailability: Within 1-2 working days
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| List Price: £ 192 |
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BS EN 60749-23:2004+A1:2011 :
Semiconductor devices. Mechanical and climatic test methods High temperature operating lifeAvailability: Within 1-2 working days
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| List Price: £ 116 |
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BS EN 60749-24:2004 :
Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased HASTAvailability: Within 1-2 working days
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| List Price: £ 116 |
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BS EN 60749-25:2003 :
Semiconductor devices. Mechanical and climatic test methods Temperature cyclingAvailability: Within 1-2 working days
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| List Price: £ 138 |
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BS EN 60749-27:2006+A1:2012 :
Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Machine model (MM)Availability: Within 1-2 working days
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| List Price: £ 138 |
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BS EN 60749-28:2017 :
Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). Device levelAvailability: Within 1-2 working days
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| List Price: £ 254 |
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BS EN 60749-29:2011 :
Semiconductor devices. Mechanical and climatic test methods Latch-up testAvailability: Within 1-2 working days
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| List Price: £ 192 |
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BS EN 60749-2:2002 :
Semiconductor devices. Mechanical and climatic test methods Low air pressureAvailability: Within 1-2 working days
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| List Price: £ 116 |
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