Title: Extreme Environment Electronics Author: H. Alan Mantooth, John D. Cressler ISBN: 1138074225 / 9781138074224 Format: Soft Cover Pages: 1042 Publisher: CRC Press Year: 2017 Availability: 2 to 3 weeks
Description
Contents
Unfriendly to conventional electronic devices, circuits, and systems, extreme environments represent a serious challenge to designers and mission architects. The first truly comprehensive guide to this specialized field, Extreme Environment Electronics explains the essential aspects of designing and using devices, circuits, and electronic systems intended to operate in extreme environments, including across wide temperature ranges and in radiation-intense scenarios such as space.
The Definitive Guide to Extreme Environment Electronics
Featuring contributions by some of the world’s foremost experts in extreme environment electronics, the book provides in-depth information on a wide array of topics. It begins by describing the extreme conditions and then delves into a description of suitable semiconductor technologies and the modeling of devices within those technologies. It also discusses reliability issues and failure mechanisms that readers need to be aware of, as well as best practices for the design of these electronics.
Continuing beyond just the "paper design" of building blocks, the book rounds out coverage of the design realization process with verification techniques and chapters on electronic packaging for extreme environments. The final set of chapters describes actual chip-level designs for applications in energy and space exploration. Requiring only a basic background in electronics, the book combines theoretical and practical aspects in each self-contained chapter. Appendices supply additional background material.
With its broad coverage and depth, and the expertise of the contributing authors, this is an invaluable reference for engineers, scientists, and technical managers, as well as researchers and graduate students. A hands-on resource, it explores what is required to successfully operate electronics in the most demanding conditions.
Preface
Part I : Introduction
Chapter 1 : Big Picture and Some History of the Field Chapter 2 : Extreme Environments in NASA Planetary Exploration Chapter 3 : Extreme Environment Electronics in NASA’s Heliophysics Vision Chapter 4 : Overview of the NASA ETDP RHESE Program Chapter 5 : Role of Extreme Environment Electronics in NASA’s Aeronautics Research Chapter 6 : Technology Options for Extreme Environment Electronics
Part II : Background
Chapter 7 : Introduction Chapter 8 : Physics of Temperature and Temperature’s Role in Carrier Transport Chapter 9 : Overview of Radiation Transport Physics and Component Effects Chapter 10 : Interaction of Radiation with Semiconductor Devices
Part III : Environments and Prediction Tools
Chapter 11 : Introduction Chapter 12 : Orbital Radiation Environments Chapter 13 : CRÈME96 and Related Error Rate Prediction Methods Chapter 14 : Monte Carlo Simulation of Radiation Effects Chapter 15 : Extreme Environments in Energy Production and Utilization Chapter 16 : Extreme Environments in Transportation
Part IV : Semiconductor Device Technologies for Extreme Environments
Chapter 17 : Introduction Chapter 18 : Radiation Effects in Si CMOS Platforms Chapter 19 : Wide Temperature Range Operation of Si CMOS Platforms Chapter 20 : Trade-Offs between Performance and Reliability in Sub-100 nm RF-CMOS on SOI Technologies Chapter 21 : SiGe HBT Platforms Chapter 22 : Using Temperature to Explore the Scaling Limits of SiGe HBTs Chapter 23 : SiC Integrated Circuit Platforms for High-Temperature Applications Chapter 24 : Passive Elements in Silicon Technology Chapter 25 : Power Device Platforms Chapter 26 : CMOS-Compatible Silicon-on-Insulator MESFETs for Extreme Environments Chapter 27 : III-Nitride Platforms Chapter 28 : Photonic Devices Chapter 29 : Radiation Hardening by Process Chapter 30 : Rad-Hard Silicon Technologies at BAE Systems Chapter 31 : Rad-Hard Silicon Technologies at Honeywell Chapter 32 : High-Temperature SOI Technologies at Honeywell
Part V : Modeling for Extreme Environment Electronic Design
Chapter 33 : Introduction Chapter 34 : TCAD of Advanced Transistors Chapter 35 : Mixed-Mode TCAD Tools Chapter 36 : Mixed-Mode TCAD for Modeling of Single-Event Effects Chapter 37 : Compact Modeling of SiGe HBTs Chapter 38 : Compact Modeling of CMOS Devices for Extreme Environments Chapter 39 : Compact Modeling of LDMOS Transistors Chapter 40 : Compact Modeling of Power Devices Chapter 41 : Best Practices for Modeling Radiation Effects in Mixed Signal Circuits Chapter 42 : Compact Model Toolkits
Part VI : Device and Circuit Reliability in Extreme Environments
Chapter 43 : Introduction Chapter 44 : Failure Mechanisms in Modern Integrated Circuits and Industry Best Practices for Reliability Degradation Predictions Chapter 45 : Considerations for the Reliability Estimation of SiGe HBTs Chapter 46 : Considerations for the Reliability Estimation of Silicon CMOS Chapter 47 : Qualification Methodology for Extreme Environment Electronics
Part VII : Circuit Design for Extreme Environments
Chapter 48 : Introduction Chapter 49 : Best Practices in Radiation Hardening by Design Chapter 50 : Investigations of RHBD Techniques for SiGe Devices and Circuits Chapter 51 : Best Practices in Wide Temperature Range Circuit Design Chapter 52 : Achieving Invariability in Analog Circuits Operating in Extreme Environments
Part VIII : Examples of Extreme Environment Circuit Designs
Chapter 53 : Introduction Chapter 54 : Voltage and Current References Chapter 55 : Operational Amplifiers Chapter 56 : Cryogenic Low-Noise Amplifiers Chapter 57 : Active Filters Chapter 58 : Analog-to-Digital Converters Chapter 59 : Digital-to-Analog Converters Chapter 60 : CMOS Phase-Locked Loops Chapter 61 : Low-Voltage, Weakly Saturated SiGe HBT Circuits Chapter 62 : Memory Circuits Chapter 63 : Field Programmable Gate Arrays Chapter 64 : Microprocessors and Microcontrollers Chapter 65 : Asynchronous Digital Circuits Chapter 66 : Characterizing SETs in Oscillator Circuits Chapter 67 : Low-Voltage Power Electronics Chapter 68 : Medium-Voltage Power Electronics Chapter 69 : SiC JFET Integrated Circuits for Extreme Environment Electronics Chapter 70 : Using CMOS-Compatible SOI MESFETs for Power Supply Management
Part IX : Verification of Analog and Mixed-Signal Systems
Chapter 71 : Introduction Chapter 72 : Model-Based Verification Chapter 73 : Event-Driven Mixed-Signal Modeling Techniques for System-in-Package Functional Verification
Part X : Packaging for Extreme Environments
Chapter 74 : Introduction Chapter 75 : Electronic Packaging Approaches for Low-Temperature Environments Chapter 76 : Electronic Packaging Approaches for High-Temperature Environments Chapter 77 : Failure Analysis of Electronic Packaging Chapter 78 : Silicon Carbide Power Electronics Packaging
Part XI : Real-World Extreme Environment Applications
Chapter 79 : Introduction Chapter 80 : A SiGe Remote Sensor Interface Chapter 81 : A SiGe Remote Electronics Unit Chapter 82 : Distributed Motor Controller for Operation in Extreme Environments Chapter 83 : Radiation-Hard Multichannel Digitizer ASIC for Operation in the Jovian Environment Chapter 84 : Approaches to Commercial Communications Satellite Design Chapter 85 : UHF Micro-Transceiver Development Project Chapter 86 : Down-Hole Instrumentation Package for Energy Well Drilling Chapter 87 : Electronics Requirements for Collider Physics Experiments Chapter 88 : Cryogenic Electronics for High-Energy Physics Experiments Chapter 89 : Radar Systems for Extreme Environments
Part XII : Appendices
Appendix A : Properties of Silicon and Germanium
Appendix B : Temperature and Energy Scales
Appendix C : Planetary Temperature Ranges and Radiation Levels
Appendix D : Ionizing Radiation Test Facilities
Appendix E : Radiation Testing Protocols and Mil-Spec Standards
Appendix F : Primer on the Semiconductor Transport Equations and Their Solution
Appendix G : Primer on MOSFETs
Appendix H : Primer on Si and SiGe Bipolar Transistors
Appendix I : Compendium of NASA’s COTS Radiation Test Data
Appendix J : Compendium of NASA’s COTS Cryogenic Test Data
Index