International Electrotechnical Commission Standards
Total Record : 8295
IEC 62396-2:2017 :
Process management for avionics - Atmospheric radiation effects - Part 2: Guidelines for single event effects testing for avionics systemsAvailability: Within 1-2 working days
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| List Price: Sfr 260 |
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IEC 62396-3:2013 :
Process management for avionics - Atmospheric radiation effects - Part 3: System design optimization to accommodate the single event effects (SEE) of atmospheric radiationAvailability: Within 1-2 working days
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| List Price: Sfr 185 |
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IEC 62396-4:2013 :
Process management for avionics - Atmospheric radiation effects - Part 4: Design of high voltage aircraft electronics managing potential single event effectsAvailability: Within 1-2 working days
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| List Price: Sfr 115 |
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IEC 62396-5:2014 :
Process management for avionics - Atmospheric radiation effects - Part 5: Assessment of thermal neutron fluxes and single event effects in avionics systemsAvailability: Within 1-2 working days
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| List Price: Sfr 150 |
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IEC 62397:2022 :
Nuclear power plants - Instrumentation and control important to safety - Resistance temperature detectorsAvailability: Within 1-2 working days
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| List Price: Sfr 220 |
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IEC 62401:2017 :
Radiation protection instrumentation - Alarming personal radiation devices (PRDs) for the detection of illicit trafficking of radioactive materialAvailability: Within 1-2 working days
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| List Price: Sfr 150 |
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| List Price: Sfr 260 |
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IEC 62403:2005 :
High density recording format on CD-R/RW disc systems - HD-BURN formatAvailability: Within 1-2 working days
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| List Price: Sfr 185 |
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IEC 62415:2010 :
Semiconductor devices - Constant current electromigration testAvailability: Within 1-2 working days
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| List Price: Sfr 40 |
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IEC 62416:2010 :
Semiconductor devices - Hot carrier test on MOS transistorsAvailability: Within 1-2 working days
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| List Price: Sfr 40 |
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IEC 62417:2010 :
Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)Availability: Within 1-2 working days
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| List Price: Sfr 20 |
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IEC 62418:2010 :
Semiconductor devices - Metallization stress void testAvailability: Within 1-2 working days
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| List Price: Sfr 115 |
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IEC 62419:2008 :
Control technology - Rules for the designation of measuring instrumentsAvailability: Within 1-2 working days
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| List Price: Sfr 75 |
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IEC 62420:2008 :
Concentric lay stranded overhead electrical conductors containing one or more gap(s)Availability: Within 1-2 working days
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| List Price: Sfr 185 |
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IEC 62421:2007 :
Electronics assembly technology - Electronic modulesAvailability: Within 1-2 working days
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| List Price: Sfr 75 |
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IEC 62423:2009 :
Type F and type B residual current operated circuit-breakers with and without integral overcurrent protection for household and similar usesAvailability: Within 1-2 working days
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| List Price: Sfr 220 |
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IEC 62424:2016 :
Representation of process control engineering - Requests in P&I diagrams and data exchange between P&ID tools and PCE-CAE toolsAvailability: Within 1-2 working days
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| List Price: Sfr 405 |
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IEC 62425:2007 :
Railway applications - Communication, signalling and processing systems - Safety related electronic systems for signallingAvailability: Within 1-2 working days
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| List Price: Sfr 360 |
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IEC 62427:2007 :
Railway applications - Compatibility between rolling stock and train detection systemsAvailability: Within 1-2 working days
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| List Price: Sfr 260 |
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IEC 62428:2008 :
Electric power engineering - Modal components in three-phase a.c. systems - Quantities and transformationsAvailability: Within 1-2 working days
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| List Price: Sfr 150 |
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IEC 62429:2007 :
Reliability growth - Stress testing for early failures in unique complex systemsAvailability: Within 1-2 working days
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| List Price: Sfr 220 |
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IEC 62430:2019 :
Environmentally conscious design (ECD) - Principles, requirements and guidanceAvailability: Within 1-2 working days
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| List Price: Sfr 220 |
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IEC 62431:2008 :
Reflectivity of electromagnetic wave absorbers in millimetre wave frequency - Measurement methodsAvailability: Within 1-2 working days
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| List Price: Sfr 290 |
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IEC 62433-1:2019 :
EMC IC modelling - Part 1: General modelling frameworkAvailability: Within 1-2 working days
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| List Price: Sfr 290 |
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IEC 62433-2:2017 :
EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE)Availability: Within 1-2 working days
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| List Price: Sfr 360 |
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