International Electrotechnical Commission Standards
Total Record : 8295
IEC 60433:2021 :
Insulators for overhead lines with a nominal voltage above 1000 V - Ceramic insulators for AC systems - Characteristics of insulator units of the long rod typeAvailability: Within 1-2 working days
| Buy This Item |
 |
| List Price: Sfr 40 |
|
| Buy This Item |
|
| List Price: Sfr 185 |
|
|
IEC 60434:1973/AMD1:1981 :
Amendment 1 - Aircraft electrical filament lampsAvailability: Within 1-2 working days
| Buy This Item |
|
| List Price: Sfr 150 |
|
|
IEC 60434:1973/AMD2:1984 :
Amendment 2 - Aircraft electrical filament lampsAvailability: Within 1-2 working days
| Buy This Item |
|
| List Price: Sfr 40 |
|
|
IEC 60436:2015 :
Electric dishwashers for household use - Methods for measuring the performanceAvailability: Within 1-2 working days
| Buy This Item |
|
| List Price: Sfr 360 |
|
|
IEC 60436:2015/AMD1:2020 :
Amendment 1 - Electric dishwashers for household use - Methods for measuring the performanceAvailability: Within 1-2 working days
| Buy This Item |
|
| List Price: Sfr 220 |
|
|
IEC 60437:1997 :
Radio interference test on high-voltage insulatorsAvailability: Within 1-2 working days
| Buy This Item |
|
| List Price: Sfr 40 |
|
|
IEC 60440:2012 :
Method of measurement of non-linearity in resistorsAvailability: Within 1-2 working days
| Buy This Item |
|
| List Price: Sfr 115 |
|
|
IEC 60441:1974 :
Photometric and colorimetric methods of measurement of the light emitted by a cathode-ray tube screenAvailability: Within 1-2 working days
| Buy This Item |
|
| List Price: Sfr 40 |
|
|
IEC 60442:1998 :
Electric toasters for household and similar purposes - Methods for measuring the performanceAvailability: Within 1-2 working days
| Buy This Item |
|
| List Price: Sfr 40 |
|
|
IEC 60442:1998/AMD1:2003 :
Amendment 1 - Electric toasters for household and similar purposes - Methods for measuring the performanceAvailability: Within 1-2 working days
| Buy This Item |
|
| List Price: Sfr 10 |
|
|
IEC 60444-11:2010 :
Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correctionAvailability: Within 1-2 working days
| Buy This Item |
|
| List Price: Sfr 75 |
|
|
IEC 60444-1:1986 :
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-networkAvailability: Within 1-2 working days
| Buy This Item |
|
| List Price: Sfr 150 |
|
|
IEC 60444-1:1986/AMD1:1999 :
Amendment 1 - Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-networkAvailability: Within 1-2 working days
| Buy This Item |
|
| List Price: Sfr 20 |
|
|
IEC 60444-2:1980 :
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal unitsAvailability: Within 1-2 working days
| Buy This Item |
|
| List Price: Sfr 40 |
|
|
IEC 60444-5:1995 :
Measurement of quartz crystal units parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correctionAvailability: Within 1-2 working days
| Buy This Item |
|
| List Price: Sfr 260 |
|
|
IEC 60444-6:2021 :
Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)Availability: Within 1-2 working days
| Buy This Item |
|
| List Price: Sfr 150 |
|
|
IEC 60444-7:2004 :
Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal unitsAvailability: Within 1-2 working days
| Buy This Item |
|
| List Price: Sfr 20 |
|
|
IEC 60444-8:2016 :
Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal unitsAvailability: Within 1-2 working days
| Buy This Item |
|
| List Price: Sfr 75 |
|
|
IEC 60444-9:2007 :
Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal unitsAvailability: Within 1-2 working days
| Buy This Item |
|
| List Price: Sfr 75 |
|
|
IEC 60445:2021 :
Basic and safety principles for man-machine interface, marking and identification - Identification of equipment terminals, conductor terminations and conductorsAvailability: Within 1-2 working days
| Buy This Item |
|
| List Price: Sfr 185 |
|
|
IEC 60447:2004 :
Basic and safety principles for man-machine interface, marking and identification - Actuating principlesAvailability: Within 1-2 working days
| Buy This Item |
|
| List Price: Sfr 150 |
|
|
IEC 60450:2004 :
Measurement of the average viscometric degree of polymerization of new and aged cellulosic electrically insulating materialsAvailability: Within 1-2 working days
| Buy This Item |
|
| List Price: Sfr 150 |
|
|
IEC 60450:2004/AMD1:2007 :
Amendment 1 - Measurement of the average viscometric degree of polymerization of new and aged cellulosic electrically insulating materialsAvailability: Within 1-2 working days
| Buy This Item |
|
| List Price: Sfr 10 |
|
|
IEC 60454-1:1992 :
Specifications for pressure-sensitive adhesive tapes for electrical purposes - Part 1: General requirementsAvailability: Within 1-2 working days
| Buy This Item |
|
| List Price: Sfr 40 |
|
|
Browse by Standards
