International Electrotechnical Commission Standards
Total Record : 8295
IEC 60512-25-5:2004 :
Connectors for electronic equipment - Tests and measurements - Part 25-5: Test 25e - Return lossAvailability: Within 1-2 working days
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| List Price: Sfr 75 |
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IEC 60512-25-6:2004 :
Connectors for electronic equipment - Tests and measurements - Part 25-6: Test 25f: Eye pattern and jitterAvailability: Within 1-2 working days
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| List Price: Sfr 115 |
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IEC 60512-25-7:2004 :
Connectors for electronic equipment - Tests and measurements - Part 25-7: Test 25g - Impedance, reflection coefficient, and voltage standing wave ratio (VSWR)Availability: Within 1-2 working days
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| List Price: Sfr 220 |
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IEC 60512-25-9:2008 :
Connectors for electronic equipment - Tests and measurements - Part 25-9: Signal integrity tests - Test 25i: Alien crosstalkAvailability: Within 1-2 working days
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| List Price: Sfr 115 |
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IEC 60512-26-100:2008 :
Connectors for electronic equipment - Tests and measurements - Part 26-100: Measurement setup, test and reference arrangements and measurements for connectors according to IEC 60603-7 - Tests 26a to 26gAvailability: Within 1-2 working days
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| List Price: Sfr 290 |
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IEC 60512-26-100:2008/AMD1:2011 :
Amendment 1 - Connectors for electronic equipment - Tests and measurements - Part 26-100: Measurement setup, test and reference arrangements and measurements for connectors according to IEC 60603-7 - Tests 26a to 26gAvailability: Within 1-2 working days
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| List Price: Sfr 10 |
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IEC 60512-27-100:2011 :
Connectors for electronic equipment - Tests and measurements - Part 27-100: Signal integrity tests up to 500 MHz on 60603-7 series connectors - Tests 27a to 27gAvailability: Within 1-2 working days
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| List Price: Sfr 330 |
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IEC 60512-27-200:2022 :
Connectors for electrical and electronic equipment - Tests and measurements - Part 27-200: Additional specifications for signal integrity tests up to 2 000 MHz on IEC 60603-7 series connectors - Tests 27a to 27gAvailability: Within 1-2 working days
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| List Price: Sfr 185 |
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IEC 60512-28-100:2019 :
Connectors for electrical and electronic equipment - Tests and measurements - Part 28-100: Signal integrity tests up to 2 000 MHz - Tests 28a to 28gAvailability: Within 1-2 working days
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| List Price: Sfr 260 |
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IEC 60512-29-100:2015 :
Connectors for electronic equipment - Tests and measurements - Part 29-100: Signal integrity tests up to 500 MHz on M12 style connectors - Tests 29a to 29gAvailability: Within 1-2 working days
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| List Price: Sfr 290 |
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IEC 60512-3-1:2002 :
Connectors for electronic equipment - Tests and measurements - Part 3-1: Insulation tests - Test 3a: Insulation resistanceAvailability: Within 1-2 working days
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| List Price: Sfr 10 |
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IEC 60512-4-1:2003 :
Connectors for electronic equipment - Tests and measurements - Part 4-1: Voltage stress tests - Test 4a: Voltage proofAvailability: Within 1-2 working days
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| List Price: Sfr 10 |
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IEC 60512-4-2:2002 :
Connectors for electronic equipment - Tests and measurements - Part 4-2: Voltage stress tests - Test 4b: Partial dischargeAvailability: Within 1-2 working days
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| List Price: Sfr 10 |
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IEC 60512-4-3:2002 :
Connectors for electronic equipment - Tests and measurements - Part 4-3: Voltage stress tests - Test 4c: Voltage proof of pre-insulated crimp barrelsAvailability: Within 1-2 working days
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| List Price: Sfr 10 |
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IEC 60512-5-1:2002 :
Connectors for electronic equipment - Tests and measurements - Part 5-1: Current-carrying capacity tests - Test 5a: Temperature riseAvailability: Within 1-2 working days
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| List Price: Sfr 10 |
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IEC 60512-5-2:2002 :
Connectors for electronic equipment - Tests and measurements - Part 5-2: Current-carrying capacity tests - Test 5b: Current-temperature deratingAvailability: Within 1-2 working days
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| List Price: Sfr 20 |
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IEC 60512-6-1:2002 :
Connectors for electronic equipment - Tests and measurements - Part 6-1: Dynamic stress tests - Test 6a: Acceleration, steady stateAvailability: Within 1-2 working days
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| List Price: Sfr 20 |
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IEC 60512-6-2:2002 :
Connectors for electronic equipment - Tests and measurements - Part 6-2: Dynamic stress tests - Test 6b: BumpAvailability: Within 1-2 working days
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| List Price: Sfr 20 |
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IEC 60512-6-3:2002 :
Connectors for electronic equipment - Tests and measurements - Part 6-3: Dynamic stress tests - Test 6c: ShockAvailability: Within 1-2 working days
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| List Price: Sfr 20 |
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IEC 60512-6-4:2002 :
Connectors for electronic equipment - Tests and measurements - Part 6-4: Dynamic stress tests - Test 6d: Vibration (sinusoidal)Availability: Within 1-2 working days
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| List Price: Sfr 20 |
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IEC 60512-6-5:1997 :
Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 6: Dynamic stress tests - Section 5: Test 6e: Random vibrationAvailability: Within 1-2 working days
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| List Price: Sfr 20 |
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IEC 60512-7-1:2010 :
Connectors for electronic equipment - Tests and measurements - Part 7-1: Impact tests (free connectors) - Test 7a: Free fall (repeated)Availability: Within 1-2 working days
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| List Price: Sfr 20 |
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IEC 60512-7-2:2011 :
Connectors for electronic equipment - Tests and measurements - Part 7-2: Impact tests (free components) - Test 7b: Mechanical strength impactAvailability: Within 1-2 working days
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| List Price: Sfr 20 |
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IEC 60512-8-1:2010 :
Connectors for electronic equipment - Tests and measurements - Part 8-1: Static load tests (fixed connectors) - Test 8a: Static load, transverseAvailability: Within 1-2 working days
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| List Price: Sfr 20 |
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IEC 60512-8-2:2011 :
Connectors for electronic equipment - Tests and measurements - Part 8-2: Static load tests (fixed connectors) - Test 8b: Static load, axialAvailability: Within 1-2 working days
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| List Price: Sfr 20 |
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