Title: Metrological Control : Industrial Measurement Management Author: Hiroshi Yano ISBN: 9283311078 / 9789283311072 Format: Hard Cover Pages: 521 Publisher: APO Year: 1991 Availability: In Stock
Description
Contents
Metrological control encompasses more than control of measurement techniques. The measurement management process involves determining what measurements to make and how to use measurement data to improve the quality of your products and processes. Metrological Control-Industrial Measurement Management presents the general tools and methods of metrological control and shows you how to design a metrological control system that can support your entire production system.
Foreword
Preface
Tables
Figures
Notation
Part 1 : Introduction Chapter 1 : Overview of Metrology Chapter 2 : Product Tolerances and Metrological Control Chapter 3 : Experimental Design Chapter 4 : Treatment of Experimental Data Chapter 5 : Comparing Measurement Methods : Finding the S/N Ratio Chapter 6 : Comparing the Merits of Different Processes : S/N Ratio with Two Controllable Factors
Part 2 : Off-Line Metrological Control Chapter 7 : Selection of Measurement Items and Optimum Production Conditions : Analysis of Variance of Multidimensional Arrays Chapter 8 : Selection of Characteristics Values : Using the L18 Orthogonal Array Chapter 9 : Parameter Design of a Measuring Instrument by Experiment : Effective Use of Orthogonal Arrays and the S/N Ratio Chapter 10 : Parameter Design of Measuring Instrument from Theory : Direct Products of L18 X L18 Orthogonal Arrays Chapter 11 : Measurement Standards and How They Are Set : Using the Sequential Categorization Method Chapter 12 : Making Stable Standard Specimens : Using Parameter Design to Combat Aging Chapter 13 : Determining Measurement Error : Specimen Error and Instrument Error Chapter 14 : Data Analysis by Orthogonal Polynomials : Missing Values and Unequal Repetitions Chapter 15 : Analysis of Discrete Data : Precise Accumulation Method Chapter 16 : Education and Training of Measurement Personnel : Application of Data Analysis Chapter 17 : Education and Training of Measurement Managers : Data Analysis for Education and Training
Part 3 : Off-Line Measurement and Process Engineering Chapter 18 : Setting Process Parameters : Combining L8 with a One-Way Layout Chapter 19 : S/N Ratio of Dynamic Characteristics : L18 X L18 Parameter Design Chapter 20 : Measurement Error and Process Error : Analysis of Variance by Split-Plot Design Chapter 21 : Effective Use of Measurement Data in Process Engineering
Part 4 : On-Line Metrological Control Chapter 22 : Inspection and Fraction Defective of Break-Even Point Chapter 23 : Loss Functions for Inspection and Control : A Simple Method of Determining Calibration Intervals Chapter 24 : Instrument Calibration in the Production Process Chapter 25 : Process Calibration Interval and Prediction Error
Part 5 : Overview Chapter 26 : Designing a Metrological Control System
Appendixes
1 : F Distribution
2 : Basic Formulas Related to the S/N Ratio
3 : Omega Conversion Table
4 : Orthogonal Arrays
5 : Normal Distribution
6 : Coefficients of Orthogonal Polynomials
Bibliography
Index
About the Author