IEC 63229:2021 :
IEC 63229:2021 : 1445455
IEC 63229:2021 :
Title: Semiconductor devices - Classification of defects in gallium nitride epitaxial film on silicon carbide substrate
Pages: 21
Year:
Publisher: International Electrotechnical Commission
Availability: Within 1-2 working days IEC will directly send the standards to End-User after our confirmation.
Title: Semiconductor devices - Classification of defects in gallium nitride epitaxial film on silicon carbide substrate
Pages: 21
Year:
Publisher: International Electrotechnical Commission
Availability: Within 1-2 working days IEC will directly send the standards to End-User after our confirmation.
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