IEC 60749-16:2003 :
IEC 60749-16:2003 : 1449790
IEC 60749-16:2003 :
Title: Semiconductor devices - Mechanical and climatic test methods - Part 16: Particle impact noise detection (PIND)
Pages: 13
Year:
Publisher: International Electrotechnical Commission
Availability: Within 1-2 working days IEC will directly send the standards to End-User after our confirmation.
Title: Semiconductor devices - Mechanical and climatic test methods - Part 16: Particle impact noise detection (PIND)
Pages: 13
Year:
Publisher: International Electrotechnical Commission
Availability: Within 1-2 working days IEC will directly send the standards to End-User after our confirmation.
Browse by Standards
