IEC 60749-2:2002 :
IEC 60749-2:2002 : 1449796
IEC 60749-2:2002 :
Title: Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure
Pages: 11
Year:
Publisher: International Electrotechnical Commission
Availability: Within 1-2 working days IEC will directly send the standards to End-User after our confirmation.
Title: Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure
Pages: 11
Year:
Publisher: International Electrotechnical Commission
Availability: Within 1-2 working days IEC will directly send the standards to End-User after our confirmation.
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