IEC 60749-37:2022 :
IEC 60749-37:2022 : 1449822
IEC 60749-37:2022 :
Title: Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
Pages: 43
Year:
Publisher: International Electrotechnical Commission
Availability: Within 1-2 working days IEC will directly send the standards to End-User after our confirmation.
Title: Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
Pages: 43
Year:
Publisher: International Electrotechnical Commission
Availability: Within 1-2 working days IEC will directly send the standards to End-User after our confirmation.
Browse by Standards
