IEC 62047-2:2006 :
IEC 62047-2:2006 : 1447666
IEC 62047-2:2006 :
Title: Semiconductor devices - Micro-electromechanical devices - Part 2: Tensile testing method of thin film materials
Pages: 25
Year:
Publisher: International Electrotechnical Commission
Availability: Within 1-2 working days IEC will directly send the standards to End-User after our confirmation.
Title: Semiconductor devices - Micro-electromechanical devices - Part 2: Tensile testing method of thin film materials
Pages: 25
Year:
Publisher: International Electrotechnical Commission
Availability: Within 1-2 working days IEC will directly send the standards to End-User after our confirmation.
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