BS EN 60749-40:2011 :
BS EN 60749-40:2011 : 1384026
BS EN 60749-40:2011 :
Title: Semiconductor devices. Mechanical and climatic test methods Board level drop test method using a strain gauge
Pages: 26
Year:
Publisher: British Standards Institution
Availability: Within 1-2 working days BSI will directly send the standards to End-User after our confirmation.
Title: Semiconductor devices. Mechanical and climatic test methods Board level drop test method using a strain gauge
Pages: 26
Year:
Publisher: British Standards Institution
Availability: Within 1-2 working days BSI will directly send the standards to End-User after our confirmation.
Browse by Standards
