BS EN 60749-37:2008 :
BS EN 60749-37:2008 : 1384022
BS EN 60749-37:2008 :
Title: Semiconductor devices. Mechanical and climatic test methods Board level drop test method using an accelerometer
Pages: 22
Year:
Publisher: British Standards Institution
Availability: Within 1-2 working days BSI will directly send the standards to End-User after our confirmation.
Title: Semiconductor devices. Mechanical and climatic test methods Board level drop test method using an accelerometer
Pages: 22
Year:
Publisher: British Standards Institution
Availability: Within 1-2 working days BSI will directly send the standards to End-User after our confirmation.
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