BS EN 62047-13:2012 :
BS EN 62047-13:2012 : 1382803
BS EN 62047-13:2012 :
Title: Semiconductor devices. Micro-electromechanical devices Bend-and shear-type test methods of measuring adhesive strength for MEMS structures
Pages: 18
Year:
Publisher: British Standards Institution
Availability: Within 1-2 working days BSI will directly send the standards to End-User after our confirmation.
Title: Semiconductor devices. Micro-electromechanical devices Bend-and shear-type test methods of measuring adhesive strength for MEMS structures
Pages: 18
Year:
Publisher: British Standards Institution
Availability: Within 1-2 working days BSI will directly send the standards to End-User after our confirmation.
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