BS EN 62047-17:2015 :
BS EN 62047-17:2015 : 1382807
BS EN 62047-17:2015 :
Title: Semiconductor devices. Micro-electromechanical devices Bulge test method for measuring mechanical properties of thin films
Pages: 34
Year:
Publisher: British Standards Institution
Availability: Within 1-2 working days BSI will directly send the standards to End-User after our confirmation.
Title: Semiconductor devices. Micro-electromechanical devices Bulge test method for measuring mechanical properties of thin films
Pages: 34
Year:
Publisher: British Standards Institution
Availability: Within 1-2 working days BSI will directly send the standards to End-User after our confirmation.
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