BS EN 62047-8:2011 :
BS EN 62047-8:2011 : 1382821
BS EN 62047-8:2011 :
Title: Semiconductor devices. Micro-electromechanical devices Strip bending test method for tensile property measurement of thin films
Pages: 22
Year:
Publisher: BSI
Availability: Within 1-2 working days BSI will directly send the standards to End-User after our confirmation.
Title: Semiconductor devices. Micro-electromechanical devices Strip bending test method for tensile property measurement of thin films
Pages: 22
Year:
Publisher: BSI
Availability: Within 1-2 working days BSI will directly send the standards to End-User after our confirmation.
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