ASTM F996 : 2011
ASTM F996 : 20111491799
ASTM F996 : 2011
Title: Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current-Voltage Characteristics
Pages: 7
Year: 2011
Publisher: American Society for Testing and Materials
Availability: Within 1-2 working days
Title: Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current-Voltage Characteristics
Pages: 7
Year: 2011
Publisher: American Society for Testing and Materials
Availability: Within 1-2 working days
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