SAE J2052 : 2016
SAE J2052 : 20161480704
SAE J2052 : 2016
Title: Test Device Head Contact Duration Analysis
Pages: 7
Year: 2016
Publisher: SAE
Availability: Within 1-2 working days
Title: Test Device Head Contact Duration Analysis
Pages: 7
Year: 2016
Publisher: SAE
Availability: Within 1-2 working days
- Description
This methodology can be used for all calculations of HIC, with all test devices having an upper neck triaxial load cell mounted rigidly to the head, and head triaxial accelerometers
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