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International Electrotechnical Commission Standards
Total Record : 8295
IEC 63044-5-3:2017 :
Home and Building Electronic Systems (HBES) and Building Automation and Control Systems (BACS) - Part 5-3: EMC requirements for HBES/BACS used in industrial environments
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IEC 63044-5-3:2017/AMD1:2022 :
Amendment 1 - Home and Building Electronic Systems (HBES) and Building Automation and Control Systems (BACS) - Part 5-3: EMC requirements for HBES/BACS used in industrial environments
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10
IEC 63044-6:2021 :
Home and building electronic systems (HBES) and building automation and control systems (BACS) - Part 6: Requirements for planning and installation
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IEC 63045:2020 :
Ultrasonics - Non-focusing short pressure pulse sources including ballistic pressure pulse sources - Characteristics of fields
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330
IEC 63046:2020 :
Nuclear power plants - Electrical power system - General requirements
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360
IEC 63047:2018 :
Nuclear instrumentation - Data format for list mode digital data acquisition used in radiation detection and measurement
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IEC 63048:2020 :
Mobile remotely controlled systems for nuclear and radiological applications - General requirements
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185
IEC 63052:2019 :
Power frequency overvoltage protective devices (POPs) for household and similar applications
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360
IEC 63055:2016 :
Format for LSI-Package-Board Interoperable design
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405
IEC 63056:2020 :
Secondary cells and batteries containing alkaline or other non-acid electrolytes - Safety requirements for secondary lithium cells and batteries for use in electrical energy storage systems
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115
IEC 63057:2020 :
Secondary cells and batteries containing alkaline or other non-acid electrolytes - Safety requirements for secondary lithium batteries for use in road vehicles not for the propulsion
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150
IEC 63067:2020 :
Electrical installations for lighting and beaconing of aerodromes - Connecting devices - General requirements and tests
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150
IEC 63068-1:2019 :
Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 1: Classification of defects
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IEC 63068-2:2019 :
Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 2: Test method for defects using optical inspection
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IEC 63068-3:2020 :
Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 3: Test method for defects using photoluminescence
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185
IEC 63068-4:2022 :
Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 4: Procedure for identifying and evaluating defects using a combined method of optical inspection and photoluminescence
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150
IEC 63073-1:2020 :
Dedicated radionuclide imaging devices - Characteristics and test conditions - Part 1: Cardiac SPECT
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185
IEC 63075:2019 :
Superconducting AC power cables and their accessories for rated voltages from 6 kV to 500 kV - Test methods and requirements
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260
IEC 63076:2019 :
Railway applications - Rolling stock - Electrical equipment in trolley buses - Safety requirements and current collection systems
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260
IEC 63077:2019 :
Good refurbishment practices for medical imaging equipment
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75
IEC 63078:2019 :
Installations for electroheating and electromagnetic processing - Test methods for induction through-heating installations
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220
IEC 63080:2017 :
Accessibility terms and definitions
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150
IEC 63085:2021 :
Radiation protection instrumentation - System of spectral identification of liquids in transparent and semitransparent containers (Raman systems)
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150
IEC 63086-1:2020 :
Household and similar electrical air cleaning appliances - Methods for measuring the performance - Part 1: General requirements
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115
IEC 63087-1:2021 :
Assistive listening devices and systems for active assisted living - Part 1: General
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40
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