International Electrotechnical Commission Standards
Total Record : 8295
IEC 60749-38:2008 :
Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memoryAvailability: Within 1-2 working days
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IEC 60749-39:2021 :
Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor componentsAvailability: Within 1-2 working days
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| List Price: Sfr 75 |
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IEC 60749-3:2017 :
Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examinationAvailability: Within 1-2 working days
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| List Price: Sfr 40 |
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IEC 60749-40:2011 :
Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gaugeAvailability: Within 1-2 working days
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| List Price: Sfr 150 |
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IEC 60749-41:2020 :
Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devicesAvailability: Within 1-2 working days
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| List Price: Sfr 150 |
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IEC 60749-42:2014 :
Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storageAvailability: Within 1-2 working days
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| List Price: Sfr 20 |
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IEC 60749-44:2016 :
Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devicesAvailability: Within 1-2 working days
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| List Price: Sfr 150 |
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IEC 60749-4:2017 :
Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)Availability: Within 1-2 working days
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| List Price: Sfr 40 |
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IEC 60749-5:2017 :
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life testAvailability: Within 1-2 working days
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| List Price: Sfr 40 |
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IEC 60749-6:2017 :
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperatureAvailability: Within 1-2 working days
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| List Price: Sfr 20 |
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IEC 60749-7:2011 :
Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gasesAvailability: Within 1-2 working days
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| List Price: Sfr 40 |
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IEC 60749-8:2002 :
Semiconductor devices - Mechanical and climatic test methods - Part 8: SealingAvailability: Within 1-2 working days
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| List Price: Sfr 75 |
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IEC 60749-9:2017 :
Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of markingAvailability: Within 1-2 working days
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| List Price: Sfr 40 |
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IEC 60751:2022 :
Industrial platinum resistance thermometers and platinum temperature sensorsAvailability: Within 1-2 working days
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| List Price: Sfr 150 |
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IEC 60754-1:2011 :
Test on gases evolved during combustion of materials from cables - Part 1: Determination of the halogen acid gas contentAvailability: Within 1-2 working days
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| List Price: Sfr 150 |
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IEC 60754-1:2011/AMD1:2019 :
Amendment 1 - Test on gases evolved during combustion of materials from cables - Part 1: Determination of the halogen acid gas contentAvailability: Within 1-2 working days
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| List Price: Sfr 20 |
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IEC 60754-2:2011 :
Test on gases evolved during combustion of materials from cables - Part 2: Determination of acidity (by pH measurement) and conductivityAvailability: Within 1-2 working days
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| List Price: Sfr 115 |
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IEC 60754-2:2011/AMD1:2019 :
Amendment 1 - Test on gases evolved during combustion of materials from cables - Part 2: Determination of acidity (by pH measurement) and conductivityAvailability: Within 1-2 working days
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| List Price: Sfr 20 |
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IEC 60754-3:2018 :
Test on gases evolved during combustion of materials from cables - Part 3: Measurement of low level of halogen content by ion chromatographyAvailability: Within 1-2 working days
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| List Price: Sfr 150 |
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IEC 60755-1:2022 :
General safety requirements for residual current operated protective devices - Part 1: Residual current operated protective devices for DC systemsAvailability: Within 1-2 working days
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| List Price: Sfr 220 |
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IEC 60755:2017 :
General safety requirements for residual current operated protective devicesAvailability: Within 1-2 working days
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| List Price: Sfr 330 |
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IEC 60756:1991 :
Non-broadcast video tape recorders - Time base stabilityAvailability: Within 1-2 working days
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| List Price: Sfr 40 |
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| List Price: Sfr 20 |
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IEC 60758:2016 :
Synthetic quartz crystal - Specifications and guidelines for useAvailability: Within 1-2 working days
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| List Price: Sfr 290 |
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IEC 60759:1983 :
Standard test procedures for semiconductor X-ray energy spectrometersAvailability: Within 1-2 working days
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| List Price: Sfr 260 |
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