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ASM Handbook Volume 10 : Materials Characterization

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Title: ASM Handbook Volume 10 : Materials Characterization
Author: ASM
ISBN: 0871700166 / 9780871700162
Format: Hard Cover
Pages: 761
Publisher: ASM International
Year: 1986
Availability: In Stock
     
 
  • Description
  • Contents

This volume provides you with an easily understood reference book on modern analytical techniques. It emphasizes the practical rather the theoretical, describing the most common applications and limitations of each method.

Sections include: Sampling, Optical and X-Ray Spectroscopy, Mass Spectroscopy, Chromatography, Classical/Electrochemical/ Radiochemical Analysis Resonance Methods, Metallographic Techniques, Diffraction Methods, Electron Optical Methods, Electron or X-Ray Spectroscopic Methods, Methods Based on Sputtering or Scattering Phenomena.

Policy on Units of Measure
Organizing Committee
Authors and Reviewers
Introduction
How to Use The Handbook

Section 1 : Sampling

Section 2 : Optical and X-Ray Spectroscopy
Optical Emission Spectroscopy
Inductively Coupled Plasma Atomic Emission Spectroscopy
Atomic Absorption Spectrometry
Ultraviolet/Visible Absorption Spectroscopy
Molecular Fluorescence Spectroscopy
X-Ray Spectrometry
Particle-Induced X-Ray Emission
Infrared Spectroscopy
Raman Spectroscopy

Section 3 : Mass Spectroscopy
Spark Source Mass Spectrometry
Gas Analysis by Mass Spectrometry

Section 4 : Classical, Electrochemical, and Radiochemical Analysis
Classical Wet Analytical Chemistry
Potentiometric Membrane Electrodes
Voltammetry
Electrogravimetry
Electrometric Titration
Controlled-Potential Coulometry
Elemental and Functional Group Analysis
High-Temperature Combustion
Inert Gas Fusion
Neutron Activation Analysis
Radioanalysis

Section 5 : Resonance Methods
Electron Spin Resonance
Ferromagnetic Resonance
Nuclear Magnetic Resonance
Mössbauer Spectroscopy

Section 6 : Metallographic Techniques
Optical Metallography
Image Analysis

Section 7 : Diffraction Methods
Introduction
X-Ray Powder Diffraction
Single-Crystal X-Ray Diffraction
Crystallographic Texture Measurement and Analysis
X-Ray Topography
X-Ray Diffraction Residual Stress Techniques
Radial Distribution Function Analysis
Small-Angle X-Ray and Neutron Scattering
Extended X-Ray Absorption Fine Structure
Neutron Diffraction

Section 8 : Electron Optical Methods
Analytical Transmission Electron Microscopy
Scanning Electron Microscopy
Electron Probe X-Ray Microanalysis
Low-Energy Electron Diffraction

Section 9 : Electron or X-Ray Spectroscopic Methods
Auger Electron Spectroscopy
X-Ray Photoelectron Spectroscopy

Section 10 : Methods Based on Sputtering or Scattering Phenomena
Field Ion Microscopy and Atom Probe Microanalysis
Low-Energy Ion-Scattering Spectroscopy
Secondary Ion Mass Spectroscopy
Rutherford Backscattering Spectrometry

Section 11 : Chromatography
Gas Chromatography/Mass Spectrometry
Liquid Chromatography
Ion Chromatography

Glossary of Terms
Metric Conversion Guide
Periodic Table of the Elements
Abbreviations and Symbols
Index

 
 
 
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