BSI Standards
Total Record : 40617
BS EN 62037-3:2012 :
Passive RF and microwave devices, intermodulation level measurement Measurement of passive intermodulation in coaxial connectorsAvailability: Within 1-2 working days
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BS EN 62037-4:2012 :
Passive RF and microwave devices, intermodulation level measurement Measurement of passive intermodulation in coaxial cablesAvailability: Within 1-2 working days
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| List Price: £ 116 |
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BS EN 62037-6:2013 :
Passive RF and microwave devices, intermodulation level measurement Measurement of passive intermodulation in antennasAvailability: Within 1-2 working days
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| List Price: £ 138 |
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BS EN 62040-1:2008+A1:2013 :
Uninterruptible power systems (UPS) General and safety requirements for UPSAvailability: Within 1-2 working days
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| List Price: £ 289 |
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BS EN 62040-4:2013 :
Uninterruptible power systems (UPS) Environmental aspects. Requirements and reportingAvailability: Within 1-2 working days
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| List Price: £ 138 |
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BS EN 62040-5-3:2017 :
Uninterruptible power systems (UPS) DC output UPS. Performance and test requirementsAvailability: Within 1-2 working days
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| List Price: £ 289 |
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BS EN 62044-1:2002 :
Cores made of soft magnetic materials. Measuring methods Generic specificationAvailability: Within 1-2 working days
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| List Price: £ 116 |
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BS EN 62044-2:2005 :
Cores made of soft magnetic materials. Measuring methods Magnetic properties at low excitation levelAvailability: Within 1-2 working days
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| List Price: £ 225 |
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BS EN 62044-3:2001 :
Cores made of soft magnetic materials. Measuring methods Magnetic properties at high excitation levelAvailability: Within 1-2 working days
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| List Price: £ 225 |
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BS EN 62047-10:2011 :
Semiconductor devices. Micro-electromechanical devices Micro-pillar compression test for MEMS materialsAvailability: Within 1-2 working days
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| List Price: £ 138 |
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BS EN 62047-11:2013 :
Semiconductor devices. Micro-electromechanical devices Test method for coefficients of linear thermal expansion of free-standing materials for micro-electromechanical systemsAvailability: Within 1-2 working days
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| List Price: £ 192 |
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BS EN 62047-12:2011 :
Semiconductor devices. Micro-electromechanical devices Bending fatigue testing method of thin film materials using resonant vibration of MEMS structuresAvailability: Within 1-2 working days
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| List Price: £ 225 |
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BS EN 62047-13:2012 :
Semiconductor devices. Micro-electromechanical devices Bend-and shear-type test methods of measuring adhesive strength for MEMS structuresAvailability: Within 1-2 working days
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| List Price: £ 138 |
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BS EN 62047-14:2012 :
Semiconductor devices. Micro-electromechanical devices Forming limit measuring method of metallic film materialsAvailability: Within 1-2 working days
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| List Price: £ 138 |
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BS EN 62047-15:2015 :
Semiconductor devices. Micro-electromechanical devices Test method of bonding strength between PDMS and glassAvailability: Within 1-2 working days
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| List Price: £ 138 |
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BS EN 62047-16:2015 :
Semiconductor devices. Micro-electromechanical devices Test methods for determining residual stresses of MEMS films. Wafer curvature and cantilever beam deflection methodsAvailability: Within 1-2 working days
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| List Price: £ 138 |
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BS EN 62047-17:2015 :
Semiconductor devices. Micro-electromechanical devices Bulge test method for measuring mechanical properties of thin filmsAvailability: Within 1-2 working days
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| List Price: £ 225 |
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BS EN 62047-18:2013 :
Semiconductor devices. Micro-electromechanical devices Bend testing methods of thin film materialsAvailability: Within 1-2 working days
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| List Price: £ 138 |
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BS EN 62047-19:2013 :
Semiconductor devices. Micro-electromechanical devices Electronic compassesAvailability: Within 1-2 working days
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| List Price: £ 225 |
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BS EN 62047-1:2016 :
Semiconductor devices. Micro-electromechanical devices Terms and definitionsAvailability: Within 1-2 working days
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| List Price: £ 225 |
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BS EN 62047-20:2014 :
Semiconductor devices. Micro-electromechanical devices GyroscopesAvailability: Within 1-2 working days
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| List Price: £ 268 |
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BS EN 62047-21:2014 :
Semiconductor devices. Micro-electromechanical devices Test method for Poisson's ratio of thin film MEMS materialsAvailability: Within 1-2 working days
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| List Price: £ 138 |
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BS EN 62047-22:2014 :
Semiconductor devices. Micro-electromechanical devices Electromechanical tensile test method for conductive thin films on flexible substratesAvailability: Within 1-2 working days
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| List Price: £ 116 |
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BS EN 62047-25:2016 :
Semiconductor devices. Micro-electromechanical devices Silicon based MEMS fabrication technology. Measurement method of pull-press and shearing strength of micro bonding areaAvailability: Within 1-2 working days
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| List Price: £ 192 |
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BS EN 62047-26:2016 :
Semiconductor devices. Micro-electromechanical devices Description and measurement methods for micro trench and needle structuresAvailability: Within 1-2 working days
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| List Price: £ 225 |
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