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IEC 60061-3Q:1995 :
IEC 60079-15:2017 :
Building Innovation : Complex Constructs in a Changing World
IEC 60061-3:1969/AMD25:2001 :
IEC 60061-3:1969/AMD26:2001 :
 
 
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Yiran Chen

Total Book : 1
 

Nonvolatile Memory Design : Magnetic, Resistive, and Phase Change

Author: Hai Li, Yiran Chen
ISBN: 1138076635 / 9781138076631
Year: 2017
Availability: 2 to 3 weeks
The manufacture of flash memory, which is the dominant nonvolatile memory technology, is facing severe technical barriers. So much so, that some emerging technologies have been proposed as alternati...
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