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Yoshihiko Sato and J. Jerry Kaufman

Total Book : 1

Value Analysis Tear-Down: A New Process for Product Development and Innovation
Author: Yoshihiko Sato and J. Jerry Kaufman
ISBN: 0831132035 / 9780831132033
Year: 2005
Availability: Out of Stock

This book presents, for the first time, a new technology for improving products and innovating new and better products, first developed in Japan by Yoshihiko Sato. Value analysis tear-down combines ...