International Electrotechnical Commission Standards
Total Record : 8295
IEC 62047-2:2006 :
Semiconductor devices - Micro-electromechanical devices - Part 2: Tensile testing method of thin film materialsAvailability: Within 1-2 working days
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| List Price: Sfr 75 |
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IEC 62047-30:2017 :
Semiconductor devices - Micro-electromechanical devices - Part 30: Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin filmAvailability: Within 1-2 working days
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| List Price: Sfr 115 |
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IEC 62047-31:2019 :
Semiconductor devices - Micro-electromechanical devices - Part 31: Four-point bending test method for interfacial adhesion energy of layered MEMS materialsAvailability: Within 1-2 working days
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| List Price: Sfr 75 |
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IEC 62047-32:2019 :
Semiconductor devices - Micro-electromechanical devices - Part 32: Test method for the nonlinear vibration of MEMS resonatorsAvailability: Within 1-2 working days
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| List Price: Sfr 115 |
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IEC 62047-33:2019 :
Semiconductor devices - Micro-electromechanical devices - Part 33: MEMS piezoresistive pressure-sensitive deviceAvailability: Within 1-2 working days
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| List Price: Sfr 150 |
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IEC 62047-34:2019 :
Semiconductor devices - Micro-electromechanical devices - Part 34: Test methods for MEMS piezoresistive pressure-sensitive device on waferAvailability: Within 1-2 working days
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| List Price: Sfr 75 |
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IEC 62047-35:2019 :
Semiconductor devices - Micro-electromechanical devices - Part 35: Test method of electrical characteristics under bending deformation for flexible electro-mechanical devicesAvailability: Within 1-2 working days
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| List Price: Sfr 150 |
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IEC 62047-36:2019 :
Semiconductor devices - Micro-electromechanical devices - Part 36: Environmental and dielectric withstand test methods for MEMS piezoelectric thin filmsAvailability: Within 1-2 working days
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| List Price: Sfr 75 |
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IEC 62047-37:2020 :
Semiconductor devices - Micro-electromechanical devices - Part 37: Environmental test methods of MEMS piezoelectric thin films for sensor applicationAvailability: Within 1-2 working days
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| List Price: Sfr 115 |
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IEC 62047-38:2021 :
Semiconductor devices - Micro-electromechanical devices - Part 38: Test method for adhesion strength of metal powder paste in MEMS interconnectionAvailability: Within 1-2 working days
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| List Price: Sfr 75 |
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IEC 62047-3:2006 :
Semiconductor devices - Micro-electromechanical devices - Part 3: Thin film standard test piece for tensile testingAvailability: Within 1-2 working days
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| List Price: Sfr 20 |
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IEC 62047-40:2021 :
Semiconductor devices - Micro-electromechanical devices - Part 40:Test methods of micro-electromechanical inertial shock switch thresholdAvailability: Within 1-2 working days
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| List Price: Sfr 40 |
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IEC 62047-41:2021 :
Semiconductor devices - Micro-electromechanical devices - Part 41: RF MEMS circulators and isolatorsAvailability: Within 1-2 working days
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| List Price: Sfr 220 |
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IEC 62047-42:2022 :
Semiconductor devices - Micro-electromechanical devices - Part 42: Measurement methods of electro-mechanical conversion characteristics of piezoelectric MEMS cantileverAvailability: Within 1-2 working days
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| List Price: Sfr 150 |
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IEC 62047-4:2008 :
Semiconductor devices - Micro-electromechanical devices - Part 4: Generic specification for MEMSAvailability: Within 1-2 working days
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| List Price: Sfr 115 |
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IEC 62047-5:2011 :
Semiconductor devices - Micro-electromechanical devices - Part 5: RF MEMS switchesAvailability: Within 1-2 working days
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| List Price: Sfr 220 |
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IEC 62047-6:2009 :
Semiconductor devices - Micro-electromechanical devices - Part 6: Axial fatigue testing methods of thin film materialsAvailability: Within 1-2 working days
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| List Price: Sfr 75 |
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IEC 62047-7:2011 :
Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS BAW filter and duplexer for radio frequency control and selectionAvailability: Within 1-2 working days
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| List Price: Sfr 185 |
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IEC 62047-8:2011 :
Semiconductor devices - Micro-electromechanical devices - Part 8: Strip bending test method for tensile property measurement of thin filmsAvailability: Within 1-2 working days
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| List Price: Sfr 115 |
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IEC 62047-9:2011 :
Semiconductor devices - Micro-electromechanical devices - Part 9: Wafer to wafer bonding strength measurement for MEMSAvailability: Within 1-2 working days
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| List Price: Sfr 150 |
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IEC 62052-11:2020 :
Electricity metering equipment - General requirements, tests and test conditions - Part 11: Metering equipmentAvailability: Within 1-2 working days
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| List Price: Sfr 360 |
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IEC 62052-21:2004 :
Electricity metering equipment (a.c.) - General requirements, tests and test conditions - Part 21: Tariff and load control equipmentAvailability: Within 1-2 working days
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| List Price: Sfr 260 |
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IEC 62052-21:2004/AMD1:2016 :
Amendment 1 - Electricity metering equipment (a.c.) - General requirements, tests and test conditions - Part 21: Tariff and load control equipmentAvailability: Within 1-2 working days
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| List Price: Sfr 75 |
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IEC 62052-31:2015 :
Electricity metering equipment (AC) - General requirements, tests and test conditions - Part 31: Product safety requirements and testsAvailability: Within 1-2 working days
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| List Price: Sfr 405 |
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IEC 62052-41:2022 :
Electricity metering equipment - General requirements, tests and test conditions - Part 41: Energy registration methods and requirements for multi-energy and multi-rate metersAvailability: Within 1-2 working days
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| List Price: Sfr 150 |
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